Quantifying the double-sided neutron SEU threat, from low energy (thermal) and high energy (>10 MeV) neutrons

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3587-3595

  Normand, E ^a,b   Vranish, K ^a,c   Sheets, A ^a,c   Stitt, M ^b,c   Kim, R ^b,d  

^a IEEE   (United States)

^b BOEING COMPANY   (United States)

^c GE AVIATION   (United States)

^d SAVE Inc   (United States)

Author keywords

Atmospheric neutron flux; Avionics SEU; BPSG; Neutron SEU; Thermal neutrons

Indexed keywords

ATMOSPHERIC NEUTRON FLUX; AVIONICS SEU; BPSG; NEUTRON SEU; THERMAL NEUTRONS;

AVIONICS; DYNAMIC RANDOM ACCESS STORAGE; MICROPROCESSOR CHIPS; STATIC RANDOM ACCESS STORAGE;

NEUTRONS;

EID: 33846270663     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.886209     Document Type: Conference Paper

References (30)

1. C. S. Guenzer, E. A. Wolicki, and R. G. Allas, "Single event upset of dynamic RAMs by neutrons, protons," IEEE Trans. Nucl. Sci., vol. NS-26, no. 6, pp. 5048-5052, Dec. 1979.
2. T. Oldham, S. Murrill, and C. Self, "Single event upset of VLSI memory circuits induced by thermal neutrons," J. Radiat. Effects, Res. Eng., vol. 5, p. 9, 1986.
3. Process Management for Avionics-Accommodation of Atmospheric Radiation Effects Via Single Event Effects Within Avionics Electronic Equipment, IEC Tech. Std. IEC TS 62396, Mar. 2006, Pt. 1.
4. Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, JEDEC Std. JESD89, July 2001, JEDEC Solid State Technol. Assoc.
5. B. Takala, "Single Event Effect," LANSCE ICE House [Online]. Available: http://www.lansce.lanl.gov/
6. R. Baumann and E. B. Smith, "Neutron induced B-10 fission as a major source of soft errors ion high density SRAMs," Proc. IEEE, vol. 97, no. 4, p. 152, Apr. 2000.
7. M. Huhtinen and F. Faccio, Computational Method to Estimate Single Event Upset Rates in an Accelerator Environment, CERN vol. NIM A450, p. 155, 2000 [Online]. Available: http://www.cern.ch/Atlas/GROUPS/FRONTEND/WWW/seu.pdf
8. R. B. Girisch, F. P. Mertens, and R. De Keersmaecker, "Determination of Si-SiO2 interface recombination parameters using a gate-controlled point-junction diode under illumination," IEEE Trans. Electron Devices, vol. 35, no. 2, p. 203, Feb. 1988.
9. T.-L. Lin, J.-S. Park, S. Gunapala, E. E. Jones, and H. M. del Castillo, "Tailorable doping-spike PtSi infrared detectors fabricated by Si molecular beam Epitaxy," Jpn. J. Appl. Phys. B, vol. 33, no. 4, p. 2435, 1994.
10. 3," Electrochem. Solid-State Lett., vol. 7, no. 5, p. G108, 2004.
11. T. Niemczyk, J. Franke, L. Zhang, D. Haaland, and K. Radigan, "Quantitative determination of dielectric thin-film properties on product wafers using infrared reflection-absorption spectroscopy," J. Vacuum Sci. Technol. A, vol. 16, no. 6, p. 3490, 1998.
12. P. J. Griffin, T. F. Luera, F. W. Sexton, P. J. Cooper, S. G. Karr, G. Hash, and E. Fuller, "The role of thermal and fission neutrons in reactor-induced upsets in commercial SRAMs," IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp. 2079-2086, Dec. 1997.
13. C. S. Guenzer, R. G. Allas, A. B. Campbell, J. Kidd, E. L. Petersen, N. Seeman, and E. A. Wolicki, "Single event upsets in RAMs induced by protons at 4.2 GeV and neutrons below 100 MeV," IEEE Trans. Nucl. Sci., vol. NS-27, no. 6, pp. 1485-1489, Dec. 1980.
14. A. D. Thouvenot, P. Trochet, R. Gailllard, and F. Desnoyers, "Neutron single event effect test results for various SRAM memories," in Proc. IEEE Radiation Effects Data Workshop, 1997, p. 61.
15. E. Normand, "Extensions of the burst generation rate method for wider application to proton/neutron-induced single event effects," IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2904-2914, Dec. 1998.
16. H. Kobayashi, H. Usuki, K. Shiraishi, H. Tsuchiya, N. Kawamoto, G. Merchant, and J. Kase, "Comparison between neutron-induced system SER and accelerated SER in SRAMs," in Proc. 42nd Int. Reliability Physics Symp., Apr. 2004, p. 288.
17. C. S. Dyer, S. Clucas, C. Sanderson, A. D. Fryland, and R. T. Green, "An experimental study of single event effects induced in commercial SRAMS by neutrons and protons from thermal energies to 500 MeV," IEEE Trans. Nucl. Sci., vol. 51, no. 5, pp. 2817-2824, Oct. 2004.
18. T. Granlund and N. Olsson, "SEUs induced by thermal to high-energy neutrons in SRAMs," presented at the 8th Eur. Conf. Radiation and Its Effects on Components and Systems, Cap d'Agde, France, Sep. 2005.
19. M. Olmos, R. Gaillard, A. Van Overberghe, J. Beaucour, S. Wen, and S. Chung, "Investigation of thermal neutron induced soft error rates in commercial SRAMs with 0.35 μm to 90 nm technologies," presented at the IEEE International Reliability Physics Symp., 2006.
20. E. Blackmore, private communication.
21. J. Ziegler, "SER effects from thermal neutrons," in SER-History, Trends and Challenges, J. Ziegler and H. Puchner, Eds. San Jose, CA: Cypress Semiconductor Corp., 2004.
22. D. Falguere, S. Duzellier, R. Ecoffet, and I. Tsourilo, "EXEQI-IV: SEE In-flight measurement on the MIR orbital station," in IEEE Radiation Effects Data Workshop, 2000, p. 89.
23. A. Lesea, private communication.
24. J. D. Dirk, M. E. Nelson, J. F. Ziegler, A. Thompson, and T. Zabel, "Terrestrial thermal neutrons," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2060-2064, Dec. 2003.
25. P. Goldhagen, M. Reginatto, T. Kniss, J. W. Wilson, R. Singleterry, I. W. Jones, and W. Van Steveninck, "Measurement of the energy spectrum of cosmic-ray induced neutrons aboard an ER-2 high altitude airplane," Nucl. Instrum. Meth. A, vol. 467, p. 52, 2002.
26. M. S. Gordon, P. Goldhagen, K. Rodbell, T. H. Zabel, H. K. Tang, J. Clem, and P. Bailey, "Measurement of the flux and energy spectrum of cosmic-ray neutrons on the ground," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3427-3434, Dec. 2004.
27. T. Nakamura, Y. Uwamino, T. Ohkubo, and A. Hara, "Altitude variation CR neutrons," Health Phys., vol. 53, p. 509, 1987.
28. T. W. Armstrong, K. Chandler, and J. Barish, "Calculation of neutron flux spectra in the earth's atmosphere by galactic cosmic rays," J. Geophys. Res., vol. 78, p. 2715, 1973.
29. C. Dyer and F. Lei, "Monte Carlo Calculations of the influence on aircraft radiation environments of structures and solar particle events," IEEE Trans. Nucl. Sci., vol. 48, no. 6, pp. 1987-1995, Dec. 2001.
30. J. Baggio, V. Ferlet-Cavrois, H. Duarte, and O. Flament, "Analysis of Proton/Neutron SEU sensitivity of commercial SRAMs - Application to the terrestrial environment test method," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3420-3425, Dec. 2004.