Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: II. Application to practical ELNES analysis of low SNR

Journal of Electron Microscopy

Volumn 55, Issue 4, 2006, Pages 225-230

  Muto, Shunsuke ^a   Tatsumi, Kazuyoshi ^a   Puetter, Richard C ^b,c   Yoshida, Tomoko ^a   Yamamoto, Yu ^a   Sasano, Yusuke ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b Pixon LLC   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Electron energy loss spectroscopy; ELNES; Low SNR; Pixon method

Indexed keywords

ALGORITHM; ARTICLE; ELECTRON PROBE MICROANALYSIS; ENERGY METABOLISM; IMAGE ENHANCEMENT; IMAGE PROCESSING; METHODOLOGY; SPECTROSCOPY;

ALGORITHMS; ELECTRON PROBE MICROANALYSIS; ENERGY METABOLISM; IMAGE ENHANCEMENT; IMAGE PROCESSING, COMPUTER-ASSISTED; SPECTRUM ANALYSIS;

DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ENERGY DISSIPATION; SIGNAL TO NOISE RATIO;

DECONVOLUTIONS; ELECTRON ENERGY-LOSS SPECTRA; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ELNES; ENERGY RESOLUTIONS; LOW SIGNAL-TO-NOISE RATIO; PIXON METHOD; RESOLUTION IMPROVEMENT; SPECTRAL FEATURE; TWO-DIMENSIONAL;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 33846260277     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfl029     Document Type: Article

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