KTa0.6Nb0.4O3 ferroelectric thin film behavior at microwave frequencies for tunable applications

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 53, Issue 12, 2006, Pages 2280-2286

  Laur, Vincent ^b   Rousseau, Anthony ^c   Tanné, Gérard ^a,b   Laurent, Paul ^a,b   Députier, Stéphanie ^d   Guilloux Viry, Maryline ^c   Huret, Fabrice ^a,b  

^a IEEE

^b CNRS   (France)

^c UNIVERSITÉ DE RENNES 1   (France)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; DEPOSITION; ELECTRIC PROPERTIES; FERROELECTRIC THIN FILMS; MICROWAVE GENERATION; POTASSIUM COMPOUNDS;

ENGRAVING PROCESS; INTERDIGITAL CAPACITORS; MICROWAVE FREQUENCIES;

FERROELECTRIC MATERIALS;

CALCIUM DERIVATIVE; NANOMATERIAL; OXIDE; PEROVSKITE; TITANIUM;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELD; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; IMPEDANCE; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; MICROWAVE RADIATION; PARTICLE SIZE; RADIATION EXPOSURE; ULTRASTRUCTURE;

CALCIUM COMPOUNDS; ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELDS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MICROWAVES; NANOSTRUCTURES; OXIDES; PARTICLE SIZE; TITANIUM;

EID: 33846259105     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2006.174     Document Type: Article

References (11)

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