Model order selection for short data: An Exponential Fitting Test (EFT)

Eurasip Journal on Advances in Signal Processing

Volumn 2007, Issue , 2007, Pages

  Quinlan, Angela ^a   Barbot, Jean Pierre ^b   Larzabal, Pascal ^b   Haardt, Martin ^c  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b Centre National de la Recherche Scientifique   (France)

^c ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; EIGENVALUES AND EIGENFUNCTIONS; MATHEMATICAL MODELS; NATURAL FREQUENCIES; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

BEARING ANGLES; EXPONENTIAL FITTING TEST (EFT); RECURSIVE ALGORITHMS; SIGNAL PROCESSING PARAMETERS;

SIGNAL FILTERING AND PREDICTION;

EID: 33846219173     PISSN: 11108657     EISSN: 16870433     Source Type: Journal    
DOI: 10.1155/2007/71953     Document Type: Article

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