Minimizing image-processing artifacts in scanning tunneling microscopy using linear-regression fitting

Review of Scientific Instruments

Volumn 77, Issue 12, 2006, Pages

  Fogarty, Daniel P ^a   Deering, Amanda L ^a   Guo, Song ^a   Wei, Zhongqing ^a   Kautz, Natalie A ^a   Kandel, S Alex ^a  

^a UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LINEAR REGRESSION FITTING; MINIMAL PROCESSING ARTIFACTS; NOISY IMAGES;

ACOUSTIC NOISE; DATA ACQUISITION; DATA PROCESSING; REGRESSION ANALYSIS; SCANNING TUNNELING MICROSCOPY; THERMAL EFFECTS;

IMAGE PROCESSING;

EID: 33846119184     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2390633     Document Type: Article

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