Observation of compensation effect for isothermal crystallization in glassy Se80-xGe20Inx and Se78-xGe 22Bix alloys

Physica Scripta

Volumn 74, Issue 5, 2006, Pages 579-583

  Mehta, N ^a   Agrahari, S K ^b   Kumar, A ^c  

^a PRANVEER SINGH INSTITUTE OF TECHNOLOGY   (India)

^b BND College   (India)

^c HARCOURT BUTLER TECHNOLOGICAL INSTITUTE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CRYSTALLIZATION; DIELECTRIC RELAXATION; DIFFUSION IN GASES; ELECTRIC CONDUCTIVITY; ISOTHERMS; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR MATERIALS;

COMPENSATION EFFECT; ELECTRONIC CONDUCTION; ISOTHERMAL CRYSTALLIZATION; MEYER-NELDEL RULE;

INTERMETALLICS;

EID: 33846077528     PISSN: 00318949     EISSN: 14024896     Source Type: Journal    
DOI: 10.1088/0031-8949/74/5/017     Document Type: Article

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