Impact of parameter variations on circuits and microarchitecture

IEEE Micro

Volumn 26, Issue 6, 2006, Pages 30-39

  Unsal, Osman S ^a   Tschanz, James W ^b   Bowman, Keith ^b   De, Vivek ^b   Vera, Xavier ^b   González, Antonio ^b,c   Ergin, Oguz ^d  

^a BARCELONA SUPERCOMPUTING CENTER   (Spain)

^b INTEL CORPORATION   (United States)

^c UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^d TOBB UNIVERSITY OF ECONOMICS AND TECHNOLOGY   (Turkey)

Author keywords

Impact of VLSI on system design; Performance and reliability; Processor architectures; Variation tolerant design

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER CIRCUITS; DESIGN FOR TESTABILITY; FAULT TOLERANT COMPUTER SYSTEMS;

PARAMETER VARIATIONS; PROCESSOR ARCHITECTURES; VARIATION-TOLERANT DESIGN;

VLSI CIRCUITS;

EID: 33846036153     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2006.122     Document Type: Article

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