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Volumn 60, Issue 1, 2007, Pages 30-50

Benchmarking the effectiveness of sequential pattern mining methods

Author keywords

Benchmarking effectiveness; Evaluating quality of results; Sequential pattern mining

Indexed keywords

BENCHMARKING; DATA STRUCTURES; INTELLIGENT AGENTS; QUALITY ASSURANCE;

EID: 33846009469     PISSN: 0169023X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.datak.2006.01.004     Document Type: Article
Times cited : (18)

References (14)
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    • J. Ayres, J. Flannick, J. Gehrke, T. Yiu, Sequential pattern mining using a bitmap representation, in: Proceedings of the ACM International Conference on Knowledge Discovery and Data Mining (SIGKDD), 2002, pp. 429-435.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.