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Surface and Interface Analysis

Volumn 38, Issue 12-13, 2006, Pages 1636-1640

Real-space visualization of the phase transition of the In/Si(111) system

(1) Lee, Geunseop a

a Inha University (South Korea)

Author keywords

Defects; Fluctuation; In; Low energy electron diffraction; Phase transition; Scanning tunneling microscopy; Silicon

Indexed keywords

DEFECTS; INDIUM; LOW ENERGY ELECTRON DIFFRACTION; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SILICON;

CURRENT VOLTAGE SPECTROSCOPY; PERIOD-DOUBLING MODULATIONS;

CRYSTAL STRUCTURE;

EID: 33845976337 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.2417 Document Type: Conference Paper

Times cited : (2)

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