-
2
-
-
0010661522
-
-
Scatturin, V.; Corliss, L.; Elliott, N.; Hastings, J. Acta Crystallogr. 1961, 14, 19.
-
(1961)
Acta Crystallogr
, vol.14
, pp. 19
-
-
Scatturin, V.1
Corliss, L.2
Elliott, N.3
Hastings, J.4
-
4
-
-
33845925298
-
-
2 pressed into pellets and contained in sealed Mo cells inside evacuated quartz tubes at 550 °C for 2 days with one intermediate grinding. For the X-ray diffraction measurements, the sample was sealed in a thin-wall capillary, 0.5 mm in diameter. Data (λ = 0.80160 Å, 2θ = 5-50°, Δ(2θ) = 0.001°) were collected at various temperatures with the high-resolution powder diffractometer on beamline ID31 at the ESRF, Grenoble. France. Data analysis was performed with the GSAS suite of Rietveld programs. Field-dependent magnetization measurements were performed between 2 and 300 K with a Quantum Design SQUID magnetometer.
-
2 pressed into pellets and contained in sealed Mo cells inside evacuated quartz tubes at 550 °C for 2 days with one intermediate grinding. For the X-ray diffraction measurements, the sample was sealed in a thin-wall capillary, 0.5 mm in diameter. Data (λ = 0.80160 Å, 2θ = 5-50°, Δ(2θ) = 0.001°) were collected at various temperatures with the high-resolution powder diffractometer on beamline ID31 at the ESRF, Grenoble. France. Data analysis was performed with the GSAS suite of Rietveld programs. Field-dependent magnetization measurements were performed between 2 and 300 K with a Quantum Design SQUID magnetometer.
-
-
-
-
5
-
-
0000915378
-
-
Hutchings, M. T.; Samuelsen, E. J.; Shirane, G.; Hirakawa, K. Phys. Rev. 1969, 188, 919.
-
(1969)
Phys. Rev
, vol.188
, pp. 919
-
-
Hutchings, M.T.1
Samuelsen, E.J.2
Shirane, G.3
Hirakawa, K.4
-
6
-
-
0001341028
-
-
Buttner, R. H.; Maslen, E. N.; Spadaccini. N. Acta Crystallogr., Sect. B: Struct. Sci. 1990, 46, 131.
-
(1990)
Acta Crystallogr., Sect. B: Struct. Sci
, vol.46
, pp. 131
-
-
Buttner, R.H.1
Maslen, E.N.2
Spadaccini, N.3
-
7
-
-
1642575268
-
-
Lufaso, M. W.; Woodward, P. M. Acta Crystallogr., Sect. B: Struct. Sci. 2004, 60, 10.
-
(2004)
Acta Crystallogr., Sect. B: Struct. Sci
, vol.60
, pp. 10
-
-
Lufaso, M.W.1
Woodward, P.M.2
-
8
-
-
33845951909
-
-
High-resolution synchrotron X-ray powder diffraction is an indirect probe of the nature of orbital ordering, and techniques such as resonant X-ray scattering and X-ray linear dichroism are needed to give direct information about orbital occupancy
-
High-resolution synchrotron X-ray powder diffraction is an indirect probe of the nature of orbital ordering, and techniques such as resonant X-ray scattering and X-ray linear dichroism are needed to give direct information about orbital occupancy.
-
-
-
-
9
-
-
84989059742
-
-
Kaiser, V.; Otto, M.; Binder, F.; Babel, D. Z. Anorg. Allg. Chem. 1990, 585, 93.
-
(1990)
Z. Anorg. Allg. Chem
, vol.585
, pp. 93
-
-
Kaiser, V.1
Otto, M.2
Binder, F.3
Babel, D.4
-
10
-
-
33845938538
-
-
The low-temperature reentrant phase transition appears to be sensitive to the cooling protocols employed in the course of the diffraction experiments
-
The low-temperature reentrant phase transition appears to be sensitive to the cooling protocols employed in the course of the diffraction experiments.
-
-
-
-
11
-
-
0001462878
-
-
Skumryev, V.; Ott, F.; Coey, J. M. D.; Anane, A.; Renard, J.-P.; Pinsard-Gaudart, L.; Revcolevschi, A. Eur. Phys. J. B 1999, 11, 401.
-
(1999)
Eur. Phys. J. B
, vol.11
, pp. 401
-
-
Skumryev, V.1
Ott, F.2
Coey, J.M.D.3
Anane, A.4
Renard, J.-P.5
Pinsard-Gaudart, L.6
Revcolevschi, A.7
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