Submicrometer optical tomography by multiple-wavelength digital holographic microscopy

Applied Optics

Volumn 45, Issue 32, 2006, Pages 8209-8217

  Montfort, Frédéric ^a   Colomb, Tristan ^a   Charrière, Florian ^a   Kühn, Jonas ^a   Marquet, Pierre ^c   Cuche, Etienne ^b   Herminjard, Sylvain ^a   Depeursinge, Christian ^a  

^a EPFL   (Switzerland)

^b Lyncee Tec SA   (Switzerland)

^c DEPT UNIV DE PSYCHIATRIE ADULTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COMPUTATIONAL GEOMETRY; HOLOGRAPHY; IMAGE ANALYSIS; MICROSCOPIC EXAMINATION; WAVE INTERFERENCE;

CONVOLUTION FORMULATION; DIGITAL HOLOGRAPHIC MICROSCOPY; OPTICAL TOMOGRAPHY;

TOMOGRAPHY;

EID: 33845941174     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.008209     Document Type: Article

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