Volterra kernels measurement and its application in nonlinear analog circuits testing

Kongzhi yu Juece/Control and Decision

Volumn 21, Issue 10, 2006, Pages

  Yin, Shi Rong ^a   Chen, Guang Ju ^a   Xie, Yong Le ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Fault diagnosis; Nonlinear analog circuit; Volterra frequency kernels

Indexed keywords

BACKPROPAGATION; COMPUTER SIMULATION; IMPULSE RESPONSE; MEASUREMENTS; NONLINEAR SYSTEMS; TESTING;

FAULT DIAGNOSIS; FAULT IDENTIFICATION RATE; NONLINEAR ANALOG CIRCUIT; VOLTERRA FREQUENCY KERNELS;

NEURAL NETWORKS;

EID: 33845931669     PISSN: 10010920     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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