Electronic and mechanical properties of MoS2-Ix nanotubes and Mo6Sxiy nanowires

Surface and Interface Analysis

Volumn 38, Issue 12-13, 2006, Pages 1530-1533

  Hassanien, A ^a   Leintschnig, G ^a   Mrzel, A ^a   Tokumoto, M ^a   Kataura, H ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Manipulation; MoS2 nanotubes; MoSxIy nanowires; Scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONIC STRUCTURE; MOLYBDENUM COMPOUNDS; NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION; STOICHIOMETRY; SYNTHESIS (CHEMICAL);

MOS2 NANOTUBES; MOSXY NANOWIRES; NANOWIRES; SCANNING PROBE MICROSCOPY;

NANOTUBES;

EID: 33845929612     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2401     Document Type: Conference Paper

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