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Volumn , Issue , 1999, Pages 65-68

An efficient simultaneous switching noise analysis of high density multi-layer packages and PCBs considering the power and ground planes

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33845909106     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICVC.1999.820825     Document Type: Conference Paper
Times cited : (4)

References (6)
  • 2
    • 0031623037 scopus 로고    scopus 로고
    • Electromagnetic modeling and signal integrity simulation of power/ground networks in high speed digital packages and printed circuit boards
    • Frank Y. Yuan "Electromagnetic Modeling and Signal Integrity Simulation of Power/Ground Networks in High Speed Digital Packages and Printed Circuit Boards," 35th DAC, pp. 427-432, 1998.
    • (1998) 35th DAC , pp. 427-432
    • Yuan, F.Y.1
  • 3
    • 0018542440 scopus 로고
    • Tree-dimensional inductance computations with partial element equivalent circuits
    • Nov.
    • P.A. Brennan, N. Raver, A.E. Ruehli, "Tree-Dimensional Inductance Computations with Partial Element Equivalent Circuits," IBM J. RES. Develop. Vol 23, No. 6, Nov. 1979.
    • (1979) IBM J. RES. Develop. , vol.23 , Issue.6
    • Brennan, P.A.1    Raver, N.2    Ruehli, A.E.3
  • 4
    • 85054341696 scopus 로고    scopus 로고
    • Pacific Numerix Co., manual
    • Pacific Numerix Co., "PCB Signal Integrity" manual, 1999.
    • (1999) PCB Signal Integrity
  • 5
    • 85054338263 scopus 로고    scopus 로고
    • A simultaneous switching noise analysis system and it's application to high speed memory module design
    • J.H. Choi, K.H. Kim, T.S. Kim, J.T. Kong, and S.H. Lee, "A Simultaneous Switching Noise Analysis System and It's Application to High Speed Memory Module Design," 5th ICVC, pp. 121-123, 1997.
    • (1997) 5th ICVC , pp. 121-123
    • Choi, J.H.1    Kim, K.H.2    Kim, T.S.3    Kong, J.T.4    Lee, S.H.5
  • 6
    • 0031374686 scopus 로고    scopus 로고
    • A simultaneous switching noise analysis of a high speed memory module including the test environment be system-level models
    • J.H. Choi, K.H. Kim, J.B. LEE, T.S. Kim, J.T. Kong, and S.H. Lee, "A Simultaneous Switching Noise Analysis of a High Speed Memory Module Including the Test Environment BE System-level Models," EPEP, pp. 109-112, 1997.
    • (1997) EPEP , pp. 109-112
    • Choi, J.H.1    Kim, K.H.2    Lee, J.B.3    Kim, T.S.4    Kong, J.T.5    Lee, S.H.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.