Leveraging disposable instrumentation to reduce coverage collection overhead

Software Testing Verification and Reliability

Volumn 16, Issue 4, 2006, Pages 267-288

  Chilakamarri, Kalyan Ram ^a   Elbaum, Sebastian ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

Dynamic instrumentation; Profiling overhead; Test coverage

Indexed keywords

COMPUTER APPLICATIONS; COMPUTER SOFTWARE SELECTION AND EVALUATION; JAVA PROGRAMMING LANGUAGE; VIRTUAL REALITY;

DYNAMIC INSTRUMENTATION; PROFILING OVERHEAD; TEST COVERAGE;

SOFTWARE ENGINEERING;

EID: 33845908726     PISSN: 09600833     EISSN: 10991689     Source Type: Journal    
DOI: 10.1002/stvr.347     Document Type: Article

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