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Volumn 2005, Issue , 2005, Pages 273-276

Application of dielectric response techniques for the condition assessment of power transformers

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CONDITION MONITORING; DIELECTRIC PROPERTIES; ELECTRIC CURRENT MEASUREMENT; ELECTRIC INSULATION; MATHEMATICAL MODELS;

EID: 33845900945     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CEIDP.2005.1560674     Document Type: Conference Paper
Times cited : (9)

References (5)
  • 2
    • 1842529229 scopus 로고    scopus 로고
    • Investigation oF Polarization and depolarization current measurements for assessment of oil-paper insulation of aged transformers
    • T.K. Saha, P. Purkait, "Investigation of Polarization and Depolarization Current Measurements for Assessment of Oil-paper Insulation of Aged Transformers", IEEE Transaction on Dielectrics and Electrical Insulation, Vol. 11, pp. 144-153, 2004.
    • (2004) IEEE Transaction on Dielectrics and Electrical Insulation , vol.11 , pp. 144-153
    • Saha, T.K.1    Purkait, P.2
  • 3
    • 22744446694 scopus 로고    scopus 로고
    • Influence of raise time on the dielectric parameters extracted from the time domain spectroscopy
    • E. David, L. Lamarre, D.N. Nguyen, "Influence of raise time on the dielectric parameters extracted from the time domain spectroscopy", IEEE Transaction on Dielectrics and Electrical Insulation, Vol. 12, pp. 423-428, 2005.
    • (2005) IEEE Transaction on Dielectrics and Electrical Insulation , vol.12 , pp. 423-428
    • David, E.1    Lamarre, L.2    Nguyen, D.N.3
  • 4
    • 33845912840 scopus 로고    scopus 로고
    • E. David, B. Noirhomme, unpublished results
    • E. David, B. Noirhomme, unpublished results.
  • 5
    • 0000855110 scopus 로고
    • An approximate method for deducing dielectric loss factor from direct-current measurements
    • B.V. Hamon, "An Approximate Method for Deducing Dielectric Loss Factor from Direct-Current Measurements", Proc. IEE, Vol. 99, pp. 151-155, 1952.
    • (1952) Proc. IEE , vol.99 , pp. 151-155
    • Hamon, B.V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.