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Volumn 2005, Issue , 2005, Pages 25-28

Extraction of frequency dependent RLCG parameters of the packaging interconnects on low-loss substrates from frequency domain measurements

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY DEPENDENCY; LOW LOSS SUBSTRATES; PACKAGING INTERCONNECTS; RLCG;

EID: 33845869291     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPEP.2005.1563691     Document Type: Conference Paper
Times cited : (11)

References (6)
  • 1
    • 0004099829 scopus 로고    scopus 로고
    • John Wiley & Sons Company, Crawfordsville
    • nd ed., John Wiley & Sons Company, Crawfordsville, 1998.
    • (1998) nd Ed.
    • Pozar, D.M.1
  • 2
    • 0026170230 scopus 로고
    • Characteristic impedance determination using propagation constant measurement
    • June
    • R. B. Marks, D. Williams, "Characteristic Impedance Determination using Propagation Constant Measurement", IEEE Microwave and Guided Wave Letters, vol. 1, no.6, pp.141-143. June 1991.
    • (1991) IEEE Microwave and Guided Wave Letters , vol.1 , Issue.6 , pp. 141-143
    • Marks, R.B.1    Williams, D.2
  • 4
    • 0026188064 scopus 로고
    • A multiline method of network analyzer calibration
    • July
    • R. B. Marks, "A Multiline Method of Network Analyzer Calibration", IEEE Trans. on Microwave Theory Techniques, vol. 39, no.7, pp.1205-1215, July 1991
    • (1991) IEEE Trans. on Microwave Theory Techniques , vol.39 , Issue.7 , pp. 1205-1215
    • Marks, R.B.1
  • 6
    • 33845902076 scopus 로고    scopus 로고
    • Electromagnetic Fields Division, Microwave Metrology Group, NIST Radio-Frequency Technology
    • National Institute of Standards and Technology, Electromagnetic Fields Division, Microwave Metrology Group, "MultiCal", NIST Radio-Frequency Technology website at http://www.eeel.nist.gov/eeel_pages/813.html
    • MultiCal


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.