Critical fidelity at the metal-insulator transition

Physical Review Letters

Volumn 97, Issue 25, 2006, Pages

  Ng, Gim Seng ^a,b   Bodyfelt, Joshua ^a   Kottos, Tsampikos ^a,b  

^a WESLEYAN UNIVERSITY   (United States)

^b MAX PLANCK INSTITUTE FOR DYNAMICS AND SELF ORGANIZATION   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; CRITICAL CURRENTS; GAUSSIAN NOISE (ELECTRONIC); LINEAR SYSTEMS; PERTURBATION TECHNIQUES; RANDOM PROCESSES;

CRITICAL FIDELITY; DECAY REGIMES; EXPONENTIAL DECAY; WIGNER LORENTZIAN RANDOM MATRIX;

METAL INSULATOR TRANSITION;

EID: 33845791619     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.256404     Document Type: Article

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