메뉴 건너뛰기




Volumn 21, Issue 11, 2006, Pages 121-126

Error analyzing of IEC flickermeter and its improving design

Author keywords

Flicker; Flickermeter; Power quality; Voltage fluctuation

Indexed keywords

COMPUTER SIMULATION; DIGITAL FILTERS; ERROR ANALYSIS; FREQUENCIES; MEASUREMENTS; POLYNOMIALS; SAMPLING;

EID: 33845780737     PISSN: 10006753     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (14)

References (12)
  • 1
    • 33845810554 scopus 로고    scopus 로고
    • Chinese source
  • 2
    • 33845725650 scopus 로고    scopus 로고
    • Chinese source
  • 3
    • 33845769983 scopus 로고    scopus 로고
    • Chinese source
  • 4
    • 3142710064 scopus 로고    scopus 로고
    • A study on calculation of short term flicker severity
    • Zhao Gang, Shi Wei, Lin Haixue. A study on calculation of short term flicker severity[J]. Power System Technology, 2001, 25(11): 15-18
    • (2001) Power System Technology , vol.25 , Issue.11 , pp. 15-18
    • Zhao, G.1    Shi, W.2    Lin, H.3
  • 5
    • 0034227082 scopus 로고    scopus 로고
    • Application of continues wavelet transform for study of voltage flicker-genernted signals
    • Hung S, Hsie. Application of continues wavelet transform for study of voltage flicker-genernted signals[J]. IEEE Transactions on Aerospace and Electric Systems, 2000, 36(3): 925-932
    • (2000) IEEE Transactions on Aerospace and Electric Systems , vol.36 , Issue.3 , pp. 925-932
    • Hsie, H.S.1
  • 7
    • 0036052309 scopus 로고    scopus 로고
    • A genetic based algorithm for voltage flicker measurement
    • Cairo, Egypt
    • AL-Hasawi W M, ELNaggar K M. A genetic based algorithm for voltage flicker measurement[C]. IEE/Melecon 2002, Cairo, Egypt, 2002: 600-604
    • (2002) IEE/Melecon 2002 , pp. 600-604
    • AL-Hasawi, W.M.1    Elnaggar, K.M.2
  • 8
    • 0035521162 scopus 로고    scopus 로고
    • Research of digital flickermeter based on IEC standard
    • Ma Yulong, Liu Lianguang, Zhang Jianhua, et al. Research of digital flickermeter based on IEC standard[J]. Proceedings of the CSEE, 2001, 21(11): 92-95
    • (2001) Proceedings of the CSEE , vol.21 , Issue.11 , pp. 92-95
    • Ma, Y.1    Liu, L.2    Zhang, J.3
  • 9
    • 3042745447 scopus 로고    scopus 로고
    • Development of flickermeter and application in electrified railways
    • He Jianmin, Huang Zhiqing, Li Qunzhan. Development of flickermeter and Application in electrified railways[J]. Journal of Southwest Jiaotong University, 2004, 39(2): 217-221
    • (2004) Journal of Southwest Jiaotong University , vol.39 , Issue.2 , pp. 217-221
    • He, J.1    Huang, Z.2    Li, Q.3
  • 10
    • 0003530101 scopus 로고    scopus 로고
    • Flickermeter, functional and design specifications
    • IEC publications prepared by technical committee, No.77 868(1986)
    • IEC publications prepared by technical committee, No.77 868(1986), Flickermeter, functional and design specifications[S]
  • 12
    • 3142710417 scopus 로고    scopus 로고
    • A new compensating-iterating algorithm for flicker calculation based on LabVIEW
    • Yao Gang, Zhao Chengyong, Deng Xiaoyun. A new compensating-iterating algorithm for flicker calculation based on LabVIEW[J]. Power System Technology, 2004, 28(10): 63-65, 75
    • (2004) Power System Technology , vol.28 , Issue.10
    • Yao, G.1    Zhao, C.2    Deng, X.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.