Single InGaAs nanowhiskers characterized by analytical transmission electron microscopy

Phase Transitions

Volumn 79, Issue 9-10, 2006, Pages 727-737

  Sudfeld, D ^a   Regolin, I ^a   Kastner J ^a   Dumpich, G ^a   Khorenko, V ^a   Prost, W ^a   Tegude, F J ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Energy dispersive X ray spectroscopy; Nanowhisker; Transmission electron microscopy; X ray diffraction

Indexed keywords

CRYSTAL GROWTH; ENERGY DISPERSIVE SPECTROSCOPY; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

LAW OF VEGARD; NANOWHISKERS;

CRYSTAL WHISKERS;

EID: 33845770242     PISSN: 01411594     EISSN: 10290338     Source Type: Journal    
DOI: 10.1080/01411590600961180     Document Type: Conference Paper

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