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Volumn 125, Issue 23, 2006, Pages
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Driving forces behind ion-ion correlations
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTINUUM MECHANICS;
CORRELATION METHODS;
ELECTROSTATICS;
ENTROPY;
MATHEMATICAL MODELS;
PERMITTIVITY;
CONTINUUM MODELS;
COUNTERIONS;
ION-ION CORRELATIONS;
REPULSIVE ENTROPIC CONTRIBUTION;
ION SOURCES;
ION;
SOLVENT;
CHEMICAL MODEL;
CHEMISTRY;
ELECTRIC CONDUCTIVITY;
ENTROPY;
LETTER;
METHODOLOGY;
MONTE CARLO METHOD;
PHYSICAL CHEMISTRY;
STATISTICAL MODEL;
TEMPERATURE;
CHEMISTRY;
CHEMISTRY, PHYSICAL;
ELECTRIC CONDUCTIVITY;
ENTROPY;
IONS;
MODELS, CHEMICAL;
MODELS, STATISTICAL;
MONTE CARLO METHOD;
SOLVENTS;
TEMPERATURE;
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EID: 33845734987
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2403878 Document Type: Article |
Times cited : (4)
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References (11)
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