Multiresolution abnormal trace detection using varied-length n-grams and automata

IEEE Transactions on Systems, Man and Cybernetics Part C: Applications and Reviews

Volumn 37, Issue 1, 2007, Pages 86-97

  Jiang, Guofei ^a   Chen, Haifeng ^a   Ungureanu, Cristian ^a   Yoshihira, Kenji ^a  

^a NEC LABORATORIES AMERICA   (United States)

Author keywords

Abnormal trace; Algorithm; Automata; Fault detection; Large scale information system; N gram

Indexed keywords

ALGORITHMS; DISTRIBUTED COMPUTER SYSTEMS;

ABNORMAL TRACE; FAULT DETECTION; LARGE-SCALE INFORMATION SYSTEM;

AUTOMATA THEORY;

EID: 33845733171     PISSN: 10946977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCC.2006.871569     Document Type: Article

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