Far-infrared reflection absorption spectroscopy: Low frequency studies on single-crystal oxide surfaces

AIP Conference Proceedings

Volumn 521, Issue , 2000, Pages 41-46

  Pilling, M ^a   He, T ^a,b   Hirschmugl, C ^a  

^a UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRONIC STRUCTURE; GEOMETRY; SINGLE CRYSTALS; SYNCHROTRON RADIATION; SYNCHROTRONS;

GAIN INFORMATION; GEOMETRICAL AND ELECTRONIC STRUCTURES; GRAZING INCIDENCE; IR REFLECTION ABSORPTION SPECTROSCOPY; LOW-FREQUENCY MODES; OXIDE SUBSTRATES; SINGLE-CRYSTAL OXIDES; SYNCHROTRON SOURCE;

SUBSTRATES;

EID: 33845729236     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1291756     Document Type: Conference Paper

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