Structure and microwave dielectric property relations in (Ba1-xSrx)5Nb4O15 system

Journal of the European Ceramic Society

Volumn 27, Issue 5, 2007, Pages 2273-2280

  Lee, Chun Te ^a   Ou, Chien Chih ^a   Lin, Yi Chang ^a   Huang, Chi Yuen ^a   Su, Che Yi ^b  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b Yageo Corporation   (Taiwan)

Author keywords

(Ba1 xSrx)5Nb4O15; Dielectrics properties; Spectroscopy; X ray methods

Indexed keywords

DIELECTRIC PROPERTIES; LATTICE CONSTANTS; MICROWAVE MEASUREMENT; RAMAN SPECTROSCOPY; STRUCTURE (COMPOSITION); VIBRATIONS (MECHANICAL); X RAY DIFFRACTION ANALYSIS;

ANHARMONIC LATTICE; MICROWAVE DIELECTRIC PROPERTY; SYMMETRIC STRETCHING VIBRATION;

BARIUM COMPOUNDS;

BARIUM COMPOUNDS; DIELECTRIC PROPERTIES; LATTICE CONSTANTS; MICROWAVE MEASUREMENT; RAMAN SPECTROSCOPY; STRUCTURE (COMPOSITION); VIBRATIONS (MECHANICAL); X RAY DIFFRACTION ANALYSIS;

EID: 33845719827     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2006.07.022     Document Type: Article

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