-
4
-
-
84869978955
-
Network analysis basics - Architecture of network analyzers
-
[Online]
-
"Network analysis basics - architecture of network analyzers," Applicat. Note 1287-2, Agilent Technologies [Online]. Available: http://www.agilent.com
-
Applicat. Note
, vol.1287
, Issue.2
-
-
-
6
-
-
0027989972
-
Calibrated vectorial nonlinear network analyzer
-
San-Diego, CA
-
T. Van den Broeck and J. Verspecht, "Calibrated vectorial nonlinear network analyzer," in Proc. IEEE MTT-S, San-Diego, CA, 1994, pp. 1069-1072.
-
(1994)
Proc. IEEE MTT-S
, pp. 1069-1072
-
-
Van Den Broeck, T.1
Verspecht, J.2
-
8
-
-
0024089126
-
High-frequency periodic time-domain waveform measurement system
-
Oct.
-
M. Sipila, K. Lehtinen, and V. Porra, "High-frequency periodic time-domain waveform measurement system," IEEE Trans. Microwave Theory Tech., vol. 36, no. 10, pp. 1397-1405, Oct. 1988.
-
(1988)
IEEE Trans. Microwave Theory Tech.
, vol.36
, Issue.10
, pp. 1397-1405
-
-
Sipila, M.1
Lehtinen, K.2
Porra, V.3
-
9
-
-
0024754871
-
Measurement of magnitude and phase of harmonics generated in nonlinear microwave two-ports
-
Oct.
-
Urs Lott, "Measurement of magnitude and phase of harmonics generated in nonlinear microwave two-ports," IEEE Trans. Microwave Theory Tech., vol. 37, no. 10, pp. 1506-1511, Oct. 1989.
-
(1989)
IEEE Trans. Microwave Theory Tech.
, vol.37
, Issue.10
, pp. 1506-1511
-
-
Lott, U.1
-
10
-
-
0025416450
-
Error-corrected large-signal wave-form measurement system combining network analyser and sampling oscilloscope capabilities
-
Apr.
-
G. Kompa and F. van Raay, "Error-corrected large-signal wave-form measurement system combining network analyser and sampling oscilloscope capabilities," IEEE Trans. Microwave Theory Tech., vol. 38, no. 4, pp. 358-365, Apr. 1990.
-
(1990)
IEEE Trans. Microwave Theory Tech.
, vol.38
, Issue.4
, pp. 358-365
-
-
Kompa, G.1
Van Raay, F.2
-
11
-
-
84937653776
-
A vector corrected high power on-wafer measurement system with a frequency range for the higher harmonics up to 40 GHz
-
M. Demmler, P.J. Tasker, and M. Schlechtweg, "A vector corrected high power on-wafer measurement system with a frequency range for the higher harmonics up to 40 GHz," in Proc. European Microwave Conf., 1994, pp. 1367-1372.
-
(1994)
Proc. European Microwave Conf.
, pp. 1367-1372
-
-
Demmler, M.1
Tasker, P.J.2
Schlechtweg, M.3
-
12
-
-
84869979054
-
-
Datasheets [Online]
-
"Microwave Components 0.001-40 GHz," Herotek, Datasheets [Online]. Available: http://www.herotek.com
-
Microwave Components 0.001-40 GHz
-
-
-
13
-
-
0028422178
-
Individual characterization of broadband sampling oscilloscopes with the nose-to-nose calibration procedure
-
Apr.
-
J. Verspecht and K. Rush, "Individual characterization of broadband sampling oscilloscopes with the nose-to-nose calibration procedure," IEEE Trans. Microwave Theory Tech., vol. 43, no. 2, pp. 354-374, Apr. 1994.
-
(1994)
IEEE Trans. Microwave Theory Tech.
, vol.43
, Issue.2
, pp. 354-374
-
-
Verspecht, J.1
Rush, K.2
-
14
-
-
0028732275
-
Broadband sampling oscilloscope characterization with the nose-to-nose calibration procedure: A theoretical analysis
-
Hamamatsu, Japan, May
-
J. Verspecht, "Broadband sampling oscilloscope characterization with the nose-to-nose calibration procedure: A theoretical analysis," in Proc. 1994 IEEE Instrumentation Measurement Technology Conf., Hamamatsu, Japan, May 1994, pp. 526-529.
-
(1994)
Proc. 1994 IEEE Instrumentation Measurement Technology Conf.
, pp. 526-529
-
-
Verspecht, J.1
-
17
-
-
0035719329
-
Measurement based nonlinear modeling of spectral regrowth
-
Dec.
-
W. Van Moer, Y. Rolain, and A. Geens, "Measurement based nonlinear modeling of spectral regrowth," IEEE Trans. Instrum. Meas., vol. 50, no. 6, pp. 1711-1716, Dec. 2001.
-
(2001)
IEEE Trans. Instrum. Meas.
, vol.50
, Issue.6
, pp. 1711-1716
-
-
Van Moer, W.1
Rolain, Y.2
Geens, A.3
-
18
-
-
0036543802
-
An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyser
-
Apr.
-
W. Van Moer, Y. Rolain, and J. Schoukens, "An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyser," IEEE Trans. Instrum. Meas., vol. 51, no. 2, pp. 337-341, Apr. 2002.
-
(2002)
IEEE Trans. Instrum. Meas.
, vol.51
, Issue.2
, pp. 337-341
-
-
Van Moer, W.1
Rolain, Y.2
Schoukens, J.3
-
19
-
-
0344444219
-
Proving the usefulness of a 3-port nonlinear vectorial network analyser through mixer measurements
-
Dec.
-
W. Van Moer and Y. Rolain, "Proving the usefulness of a 3-port nonlinear vectorial network analyser through mixer measurements," IEEE Trans. Instrum. Meas., vol. 52, no. 6, pp. 1834-1837, Dec. 2003.
-
(2003)
IEEE Trans. Instrum. Meas.
, vol.52
, Issue.6
, pp. 1834-1837
-
-
Van Moer, W.1
Rolain, Y.2
-
20
-
-
2942598536
-
Measuring the sensitivity of microwave components to bias variations
-
June
-
W. Van Moer and Y. Rolain, "Measuring the sensitivity of microwave components to bias variations," IEEE Trans. Instrum. Meas., vol. 53, no. 3, pp. 787-791, June 2004.
-
(2004)
IEEE Trans. Instrum. Meas.
, vol.53
, Issue.3
, pp. 787-791
-
-
Van Moer, W.1
Rolain, Y.2
-
21
-
-
2942599968
-
Why are nonlinear microwave systems measurements so involved?
-
June
-
Y. Rolain, W. Van Moer, G. Vandersteen, and J. Schoukens, "Why are nonlinear microwave systems measurements so involved?" IEEE Trans. Instrum. Meas., vol. 53, no. 3, pp. 726-729, June 2004.
-
(2004)
IEEE Trans. Instrum. Meas.
, vol.53
, Issue.3
, pp. 726-729
-
-
Rolain, Y.1
Van Moer, W.2
Vandersteen, G.3
Schoukens, J.4
|