Improving the spatial resolution of a magnetic force microscope tip via focused ion beam modification and magnetic film coating

Scripta Materialia

Volumn 56, Issue 5, 2007, Pages 365-368

  Huang, H S ^a   Lin, M W ^a   Sun, Y C ^a   Lin, L J ^a  

^a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Coating; Ion beam processing; Magnetic force microscope (MFM); Magnetic recording; Magnetic thin film

Indexed keywords

ASPECT RATIO; COATING TECHNIQUES; ION BEAMS; MAGNETIC RECORDING; MAGNETIC THIN FILMS; MILLING (MACHINING);

ION BEAM PROCESSING; MAGNETIC FILM COATINGS; MAGNETIC FORCE MICROSCOPE (MFM);

MAGNETIC DEVICES;

EID: 33845678434     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2006.11.014     Document Type: Article

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