Spectral and power stability tests of deep UV LEDs for AC charge management

AIP Conference Proceedings

Volumn 873, Issue , 2006, Pages 215-219

  Sun, Ke Xun ^a   Higuchi, Sei ^a   Goh, Allex ^a   Allard, Brett ^a   Gill, Dale ^a   Buchman, Saps ^a   Byer, Robert ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

AC charge management; Lifetime; Power stability; Spectral stability; UV LEDs

Indexed keywords

EID: 33845662795     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2405046     Document Type: Conference Paper

References (9)

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