Characterization of defects in semiconductors using radioactive isotopes

Physica B: Condensed Matter

Volumn 389, Issue 1, 2007, Pages 51-57

  Deicher, Manfred ^a,b  

^a SAARLAND UNIVERSITY   (Germany)

^b CERN   (Switzerland)

Author keywords

Defects; ISOLDE; Semiconductors

Indexed keywords

DEFECTS; DIFFUSION; MATERIALS SCIENCE; MOSSBAUER SPECTROSCOPY; RADIOISOTOPES; SOLID STATE PHYSICS;

EMISSION CHANNELING; ISOLDE; PERTURBED ANGULAR CORRELATION; RADIOACTIVE ATOMS;

SEMICONDUCTOR MATERIALS;

EID: 33845637377     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.07.035     Document Type: Article

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