Analysis of interfacial micromechanics of model composites using synchrotron microfocus X-ray diffraction

Journal of Materials Science

Volumn 41, Issue 20, 2006, Pages 6813-6821

  Shyng, Y T ^a   Bennett, J A ^a   Young, R J ^a   Davies, R J ^b   Eichhorn, S J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CRYSTAL STRUCTURE; EMBEDDED SYSTEMS; EPOXY RESINS; RAMAN SPECTROSCOPY; SHEAR STRESS; SYNCHROTRONS; X RAY DIFFRACTION;

CRYSTAL STRAIN; EMBEDDED MODEL COMPOSITES; INTERFACIAL MICROMECHANICS; SYNCHROTRON MICROFOCUS X-RAY DIFFRACTION;

COMPOSITE MICROMECHANICS;

EID: 33845623760     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-0211-8     Document Type: Article

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