User interface defect detection by hesitation analysis

Proceedings of the International Conference on Dependable Systems and Networks

Volumn 2006, Issue , 2006, Pages 61-70

  Reeder, Robert W ^a   Maxion, Roy A ^a  

^a Carnegie Mellon University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; ERROR DETECTION; PROBLEM SOLVING; PRODUCT DESIGN;

HESITATION ANALYSIS; INTERFACE DEFECTS; MISSION-CRITICAL APPLICATIONS; THRESHOLD PARAMETERS;

USER INTERFACES;

EID: 33845597811     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2006.71     Document Type: Conference Paper

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