Further study on two-thickness-method for simultaneous measurement of complex em parameters based on open-ended coaxial probe

35th European Microwave Conference 2005 - Conference Proceedings

Volumn 1, Issue , 2005, Pages 505-508

  Chen, Chun Ping ^a   Ma, Zhewang ^b   Anada, Tetsuo ^a   Hsu, Jui Pang ^a  

^a KANAGAWA UNIVERSITY   (Japan)

^b SAITAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL EQUATIONS; ERROR DETECTION; MAGNETIC PERMEABILITY; PERMITTIVITY MEASUREMENT;

COAXIAL PROBES; ERROR FACTORS; TWO THICKNESS METHODS (TTM); UNCERTAINTY PREDICTIONS;

ELECTROMAGNETIC WAVES;

EID: 33845577512     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMC.2005.1608904     Document Type: Conference Paper

References (8)

1. L.F. Chen, et al, Microwave electronics: measurement and materials characterization, New York: Wiley, 2004
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3. Niu Maode, Su Yong, et al, "An Improved Open-Ended Waveguide Measurement Technique on Parameters ε̇ and μ̇ of High-Loss Materials," IEEE Transactions on Instrumentation and Measuremen, vol.47, no.2, pp.476-481, April, 1999
4. James Baker-Jarvis et al., "Analysis of an Open-Ended Coaxial Probe with Lift-Off for Nondestructive Testing, IEEE Transactions on Instrumentation and Measurement," vol.43, no.5, pp.711-717, Oct. 1994
5. C.-L. Li and K.-M. Chen, "Determination of electromagnetic properties of materials using flanged open-ended coaxial probe - Full-wave analysis," IEEE Transactions on Instrumentation and Measurement, vol. 44, pp. 19-27, 1995.
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7. Chen ChunPing, Yu JianPing, et al., "Measurement of Complex EM Parameters Using a Coaxial Probe -Uncertainty Analysis," Proceedings of Cross Strait Tri-Regional Radio Science and Wireless Technology Conference 2003, Shanghai, China, pp81-84, 2003(in Chinese)
8. Arai M., Binner J.G.P.,Cross T.E., "Estimating errors due to sample surface roughness in microwave complex permittivity measurements obtained using a coaxial probe," Electronics Letters, v 31, n2, Jan 19, pp. 115-117, 1995