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Volumn 29, Issue 5, 2006, Pages 535-546
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Structural and electrochemical behaviour of sputtered vanadium oxide films: Oxygen non-stoichiometry and lithium ion sequestration
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Author keywords
Amorphous films; Structural and electrochemical properties; Vanadium oxide films
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Indexed keywords
ELECTROCHEMICAL PROPERTIES;
LITHIUM ION SEQUESTRATION;
OPEN CIRCUIT VOLTAGES (OCV);
VANADIUM OXIDE FILMS;
ELECTRIC PROPERTIES;
OXYGEN;
SPUTTER DEPOSITION;
VANADIUM COMPOUNDS;
X RAY PHOTOELECTRON SPECTROSCOPY;
AMORPHOUS FILMS;
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EID: 33845570243
PISSN: 02504707
EISSN: None
Source Type: Journal
DOI: 10.1007/BF02914086 Document Type: Article |
Times cited : (14)
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References (28)
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