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Volumn 29, Issue 5, 2006, Pages 535-546

Structural and electrochemical behaviour of sputtered vanadium oxide films: Oxygen non-stoichiometry and lithium ion sequestration

Author keywords

Amorphous films; Structural and electrochemical properties; Vanadium oxide films

Indexed keywords

ELECTROCHEMICAL PROPERTIES; LITHIUM ION SEQUESTRATION; OPEN CIRCUIT VOLTAGES (OCV); VANADIUM OXIDE FILMS;

EID: 33845570243     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02914086     Document Type: Article
Times cited : (14)

References (28)
  • 14
    • 33845587994 scopus 로고    scopus 로고
    • JANAF Thermodynamic Tables 1998 ACS, APS and NIST: New York, 11th Edition
    • JANAF Thermodynamic Tables 1998 ACS, APS and NIST: New York, 11th Edition


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.