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Volumn 2006, Issue , 2006, Pages 115-119

Using data mining technology to improve manufacturing quality - A case study of LCD driver IC packaging industry

Author keywords

Data mining; Data warehouse; Decision tree; LCD driver IC packaging

Indexed keywords

ALGORITHMS; CHIP SCALE PACKAGES; DATA ACQUISITION; DATA MINING; DATA WAREHOUSES; DECISION TABLES; INFORMATION RETRIEVAL; NEURAL NETWORKS;

EID: 33845562413     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SNPD-SAWN.2006.75     Document Type: Conference Paper
Times cited : (14)

References (11)
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  • 3
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    • T.F. Burgess, H.K. Gules, J.N.D. Gupta, M. Tekin: Competitive Priorities, Process Innovations and Time-Based Competition in the Manufacturing Sectors of Industrializing Economies: The Case of Turkey, Bench-marking for Quality Management & Technology 15(4), 1998, pp.304-316.
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  • 5
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    • E-service: A new paradigm for business in the electronic environment
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    • Rust, R.T.1    Kannan, P.K.2
  • 6
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    • Data completeness: A key to effective net- based customer service systems
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    • (2003) Communications of the ACM , vol.46 , Issue.6 , pp. 47-51
    • Brohman, M.K.1    Watson, R.T.2    Piccoli, G.3    Parasuraman, A.4
  • 7
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    • Mastering data mining: The art & science of customer relationship management
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    • Michael J.A. Berry, Gordon S Linoff, Mastering Data Mining: The Art & Science of Customer Relationship Management, John Wiley and Sons, New York, 2000.
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    • Berry, M.J.A.1    Linoff, G.S.2
  • 8
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    • Data mining: Concepts and techniques
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    • Han, J. and M. Kamber, Data Mining: Concepts and Techniques, Morgan Kaufmann, San Francisco, CA, USA, 2001.
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  • 10
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    • Developing data mining framework and methods for diagnosing semiconductor manufacturing defects and an empirical study of wafer acceptance test data in a wafer FAB
    • Chen-Fu Chien, Ting-Hao Lin, Cheng-Yung Peng, Shao-Chung Hsu, Developing Data Mining Framework and Methods for Diagnosing Semiconductor Manufacturing Defects and an Empirical Study of Wafer Acceptance Test Data in A wafer FAB, Journal of the Chinese Institute of Industrial Engineers, 18(4), 2000, pp.37 -48.
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  • 11
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    • Constructing semiconductor manufacturing performance indexes and applying data mining for manufacturing data analysis
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.