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Volumn 5, Issue 1-2, 1995, Pages 1-7
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High-resolution electron microscopy and X-ray diffraction studies of MCM-48
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Author keywords
High resolution electron microscopy; M41S; MCM 48; Pore architecture; X ray diffraction
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Indexed keywords
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EID: 33845511963
PISSN: 09276513
EISSN: None
Source Type: Journal
DOI: 10.1016/0927-6513(95)00030-D Document Type: Article |
Times cited : (89)
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References (22)
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