Systems analysis evaluation of gamma-ray detectors for remote monitoring applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2859, Issue , 1996, Pages 2-9

  Antolak, A J ^a   Lund, J C ^a   Lamonds, H A ^a   James, R B ^a   Hinton, J ^a   Thomas, G ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Gamma ray detectors; Quality factor; Remote monitoring; Scintillators; Semiconductors; Systems analysis

Indexed keywords

PHOSPHORS; QUALITY CONTROL; RADIOACTIVE MATERIALS; REMOTE CONTROL; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; SYSTEMS ANALYSIS; X RAYS;

ANALYSIS EVALUATION; DETECTOR SYSTEMS; GAMMA RAY DETECTOR; NUCLEAR MATERIAL; QUALITY FACTORS; REMOTE MONITORING; SEMICONDUCTOR-TYPE;

GAMMA RAYS;

EID: 33845503432     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.245115     Document Type: Conference Paper

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