Surface roughness of thin gold films and its effects on the proton energy loss straggling

Brazilian Journal of Physics

Volumn 36, Issue 3 B, 2006, Pages 956-959

  Cdedon C ^a   Flores, M ^a,b   Haberle P ^a   Valdes J E ^a  

^a DEPARTAMENTO DE FÍSICA   (Chile)

^b PONTIFICIA UNIVERSIDAD CATÓLICA DE VALPARAÍSO   (Chile)

Author keywords

Atomic Force Microscopy; Ion scattering; Self supported thin films

Indexed keywords

EID: 33845448342     PISSN: 01039733     EISSN: 01039733     Source Type: Journal    
DOI: 10.1590/s0103-97332006000600042     Document Type: Conference Paper

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