Linear thermal expansion measurements of single crystal silicon for validation of interferometer based cryogenic dilatometer

AIP Conference Proceedings

Volumn 824 I, Issue , 2006, Pages 35-42

  Karlmann, P B ^a   Klein, K J ^a   Halverson, P G ^a   Peters, R D ^a   Levine, M B ^a   Van Buren, D ^a   Dudik, M J ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Dilatometer; Single crystal silicon; Thermal expansion; Thermal strain

Indexed keywords

EID: 33845448328     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2192331     Document Type: Conference Paper

References (5)

1. Dudik, M. J., et al., "Development of a Precision Cryogenic Dilatometer for the James Webb Space Telescope Materials Testing," SPIE Proceedings 5179, pp. 155-164 (2003).
2. Karlmann, P. B. et al., "Continued development of a precision cryogenic dilatometer for the James Webb Space Telescope," SPIE Proceedings 5528, pp. 63-71 (2004).
3. Swenson, C. A., "Recommended Values for the Thermal Expansivity of Silicon from 0 to 1000K," J. Phys. Chem. Ref. Data 12, No. 2, pp. 179-182 (1983).
4. Lyon, K. G. et al., "Linear thermal expansion measurements on silicon from 6 to 340K," J. Appl. Phys. 48, No. 3, pp. 865-868 (1977).
5. Yamada, N. and Okaji, M., "Development of a low-temperature laser interferometric dilatometer using a cryogenic refrigerator," High Temp. - High Press. 32, pp. 199-205 (2000).