Parameter-oriented CRS imaging

SEG Technical Program Expanded Abstracts

Volumn 25, Issue 1, 2006, Pages 2966-2970

  Hoecht, German ^a   Patrice, Ricarte ^a,b  

^a OPERA ^*

^b IFP ENERGIES NOUVELLES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33845432227     PISSN: 10523812     EISSN: None     Source Type: Book Series    
DOI: 10.1190/1.2370144     Document Type: Article

References (2)

1. Hoecht, G., E. Landa, and R. Baina, 2004, Seimic data interpolation using local wavefield characteristics: 66th Annual Conference and Exhibition, EAGE, Extended Abstracts, D031.
2. Jäger, R., J. Mann, G. Höcht, and P. Hubral, 2001, Common-reflection-surface stack: Image and attributes: Geophysics, 66, 97-09. gpy GPYSA7 0016-8033 Geophysics