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Volumn 91, Issue 5, 2002, Pages 3085-3089

Surface relaxation effects on the properties of porous silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33845429677     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1446658     Document Type: Article
Times cited : (19)

References (28)
  • 15
    • 33845417914 scopus 로고    scopus 로고
    • Molecular Simulation, Inc. San Diego
    • 2 User Guide, Month 1994. (Molecular Simulation, Inc. San Diego 1997).
    • (1997) 2 User Guide, Month 1994
  • 27
    • 0343438384 scopus 로고    scopus 로고
    • edited by L. Canham (IEEE, London)
    • Properties of Porous Silicon, edited by L. Canham (IEEE, London, 1997), p. 207.
    • (1997) Properties of Porous Silicon , pp. 207


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.