Thermal imaging at general electric

AIP Conference Proceedings

Volumn 820 I, Issue , 2006, Pages 523-528

  Ringermacher, H I ^a   Howard, D R ^a   Knight, B ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

Coating thickness; Quenching; Thermal imaging

Indexed keywords

EID: 33845422924     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2184572     Document Type: Conference Paper

References (7)

1. H.I. Ringermacher, D.J. Mayton, D.R. Howard and B.N. Cassenti, "Towards a Flat-Bottom Hole Standard for Thermal Imaging", Review of Progress in QNDE 17, edited by D. O. Thompson and D. E. Chimenti, Plenum Press, New York, NY, 1998, pp. 425-429.
2. H. I. Ringermacher and D. R. Howard, "Synthetic Thermal Time-of-Flight (STTOF) Depth Imaging", Review of Progress in Quantitative Nondestructive Evaluation 20, edited by D. O. Thompson and D. E. Chimenti, Plenum Press, New York, NY, 2001, pp. 487-491.
3. H. I. Ringermacher, D. R. Howard and R. J. Filkins, "Flash-Quenching for High Resolution Thermal Depth Imaging", in Review of Progress in Quantitative Nondestructive Evaluation 23, edited by D. O. Thompson and D. E. Chimenti, AIP Conference Proceedings vol. 700, American Institute of Physics, Melville, NY, 2004, pp. 477-481.
4. nd Review of Progress in Quantitative Nondestructive Evaluation, Bowdoin College, Brunswick, ME (July 31-Aug 5, 2005).
5. R. Filkins, H. I. Ringermacher and R. Zhang, "Actively Quenched Lamp, Infrared Thermography Imaging System, and Method for Actively Controlling Flash Duration," GE-RD120631, Patent Pending.
6. R. Filkins, H. I. Ringermacher and R. Zhang, "Method for Introducing Artificial Flaws in Ceramic Matrix Composites", GE-RD34505, Patent Pending.
7. H. I. Ringermacher, D. R. Howard and R.S. Gilmore, "Discriminating porosity in composites using Thermal Depth Imaging", Review of Progress in Quantitative Nondestructive Evaluation 21, edited by D. O. Thompson and D. E. Chimenti, AIP Conference Proceedings vol. 615, American Institute of Physics, Melville, NY, 2002, pp. 528-535.