Microstructure and electrical properties of Nb2O5 doped titanium dioxide

Materials Science and Engineering: B

Volumn 136, Issue 1, 2007, Pages 15-19

  Fang, Xiangyi ^a   Oh, J T ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Ceramics; Electrical properties; Electron microscopy; Electronic materials

Indexed keywords

CERAMIC MATERIALS; CRYSTAL MICROSTRUCTURE; CRYSTAL STRUCTURE; DOPING (ADDITIVES); ELECTRIC PROPERTIES; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; NIOBIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

ELECTRONIC MATERIALS; LATTICE IMAGES; SEMICONDUCTOR CERAMICS; SINTERING TEMPERATURE;

TITANIUM DIOXIDE;

EID: 33845420595     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.06.032     Document Type: Article

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