Living with failure: Lessons from nature?

Proceedings - Eleventh IEEE European Test Symposium, ETS 2006

Volumn 2006, Issue , 2006, Pages 4-5

  Furber, Steve ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; MULTIPROCESSING SYSTEMS; PRODUCT DESIGN; RELIABILITY THEORY; TRANSISTORS;

DEVICE RELIABILITY; FAILURE RATES; PARAMETER VARIABILITY; PRODUCTION TESTS;

CHIP SCALE PACKAGES;

EID: 33845420096     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2006.28     Document Type: Conference Paper

References (0)