Structural distortion in thiourea-mixed ADP crystals

Applied Surface Science

Volumn 253, Issue 2, 2006, Pages 944-949

  Jayarama, A ^a   Dharmaprakash, S M ^a  

^a MANGALORE UNIVERSITY   (India)

Author keywords

Non linear; X ray diffraction

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; DIFFRACTOMETERS; NITROGEN COMPOUNDS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

AMMONIUM DIHYDROGEN PHOSPHATE (ADP); SLOW EVAPORATION SOLUTION; STRUCTURAL DISTORTION; X RAY DIFFRACTOMETERS;

SINGLE CRYSTALS;

EID: 33845417478     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.01.051     Document Type: Article

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