Characterization of bonded piezoelectric sensor performance and durability in simulated aircraft environments

AIP Conference Proceedings

Volumn 820 II, Issue , 2006, Pages 1694-1701

  Blackshire, James L ^a   Cooney, Adam T ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Displacement field imaging; Piezo wafer active sensors; Structural health monitoring

Indexed keywords

EID: 33845417017     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2184725     Document Type: Conference Paper

References (8)

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8. Blackshire, J., "Interferometric and Holographic Imaging of Surface Wave Patterns for Characterization of Material Degradation," Nondestructive Materials Characterization with Applications to Aircraft Materials, N. Meyendorf, P. Nagy, and S. Rokhlin editors, Springer-Verlag, New York, 2003, pp. 113-140.