Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures

AIP Conference Proceedings

Volumn 824 I, Issue , 2006, Pages 61-68

  Duckworth, R C ^a   Demko, J A ^a   Gouge, M J ^a   Urbahn, J A ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

Emissivity; Silver plated copper; Water degradation

Indexed keywords

EID: 33845409760     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2192334     Document Type: Conference Paper

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