Simulation of transients caused by single-event upsets in combinational logic

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 973-981

  Mohanram, Kartik ^a  

^a Rice University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOSED FORM MODELS; COMPUTATIONAL SPEED; PEAK MAGNITUDE; SINGLE EVENT UPSETS (SEU);

COMPUTER SIMULATION; LOGIC CIRCUITS; MATHEMATICAL MODELS; TRANSIENTS;

COMBINATORIAL CIRCUITS;

EID: 33845405260     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584063     Document Type: Conference Paper

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