메뉴 건너뛰기




Volumn 55, Issue 2, 2007, Pages 443-453

Improved Cr2O3 adhesion by Ce ion implantation in the presence of interfacial sulfur segregation

Author keywords

Adhesion; Cr2O3 scale; Oxidation; Reactive element effect; Sulfur segregation

Indexed keywords

ADHESION; AGGLOMERATION; AUGER ELECTRON SPECTROSCOPY; ION IMPLANTATION; OXIDATION; SULFUR;

EID: 33845399774     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.07.047     Document Type: Article
Times cited : (52)

References (45)
  • 22
    • 33845397878 scopus 로고    scopus 로고
    • Stringer J, Hou PY. In: Srinivasan V, Vedula K, editors. Proc symp on corrosion and particle erosions at high temperatures, TMS annual meeting, Las Vegas, NV, 27 February-3 March 1989. p. 383-401.
  • 28
    • 33845454745 scopus 로고    scopus 로고
    • Hou PY, Stringer J. In Mattox DM, Baglin JEE, Gottschall RJ, Batich CD, editors. Proc symp adhesion in solids. MRS spring meeting, Reno, NV, vol. 119, 5-9 April 1988. p. 205-11.
  • 31
    • 33845440372 scopus 로고    scopus 로고
    • + implantation into preformed oxides on the subsequent oxidation of GH128 alloy at 1000 °C. J Mater Sci Technol, in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.