메뉴 건너뛰기




Volumn 62, Issue 12, 2006, Pages

A flip-disorder in the structure of 3-[2-(anthracen-9-yl)ethenyl]thiophene

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33845394747     PISSN: 16005368     EISSN: 16005368     Source Type: Journal    
DOI: 10.1107/S1600536806048586     Document Type: Article
Times cited : (10)

References (12)
  • 5
    • 33747157299 scopus 로고    scopus 로고
    • Oxford Diffraction (release 23-03-2006 CrysAlis171. NET; compiled Mar 23 2006, 23:39:28). Oxford Diffraction, Abingdon, Oxfordshire, England
    • Oxford Diffraction (2006). CrysAlis CCD and CrysAlis RED. Versions 1.171.29.9 (release 23-03-2006 CrysAlis171. NET; compiled Mar 23 2006, 23:39:28). Oxford Diffraction, Abingdon, Oxfordshire, England.
    • (2006) CrysAlis CCD and CrysAlis RED. Versions 1.171.29.9
  • 8
    • 0003523317 scopus 로고
    • Siemens Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1989). Stereochemical Workstation Operation Manual. Release 3.4. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1989) Stereochemical Workstation Operation Manual. Release 3.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.