Review of synthetically focused guided wave imaging techniques with application to defect sizing

AIP Conference Proceedings

Volumn 820 I, Issue , 2006, Pages 142-149

  Davies, J ^a   Simonetti, F ^a   Lowe, M ^a   Cawley, P ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Arrays; Imaging; Resolution; Ultrasonic testing

Indexed keywords

EID: 33845391877     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2184522     Document Type: Conference Paper

References (10)

1. Waszak, J., Ludwig, R., IEEE Trans. Instrum. Meas. 39, 441-444, (1990).
2. Sicard, R., Chahbaz, A., Goyette, J., IEEE Trans. Ultrason. Ferroelec. Freq. Cont. 51, 1287-1297, (2004).
3. Wilcox, P.D., IEEE Trans. Ultrason. Ferroelec. Freq. Cont. 50, 699-709, (2003).
4. Karaman, M., Li, P., O'Donnell, M., IEEE Trans. Ultrason. Ferroelec. Freq. Cont. 42, 429-441, (1995).
5. Holmes, C., Drinkwater, B.W., Wilcox, P.D, Insight. 47 issue 2, 88-90, (2005).
6. Wilcox, P.D., IEEE Trans. Ultrason. Ferroelec. Freq. Cont. 50, 419-427, (2003).
7. Pavlakovic, B., Lowe, M.J.S., Alleyne, D.N., Cawley, P. Review of Progress in quantitative NDE. 16, 185-192, (1997).
8. Busse, L.J., IEEE Trans. Ultrason. Ferroelec. Freq. Cont. 39, 174-179, (1992).
9. Goodman, J.W., 'Fourier Optics', McGraw-Hill, publisher, London, UK (1996).
10. Chiao, R.Y., IEEE Trans. Ultrason. Ferroelec. Freq. Cont. 41, 484-493, (1994).