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Volumn 58, Issue 4, 1986, Pages 844-848
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Measurements within the Diffusion Layer Using a Microelectrode Probe
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33845373512
PISSN: 00032700
EISSN: 15206882
Source Type: Journal
DOI: 10.1021/ac00295a044 Document Type: Article |
Times cited : (293)
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References (29)
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