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Volumn 58, Issue 4, 1986, Pages 844-848

Measurements within the Diffusion Layer Using a Microelectrode Probe

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EID: 33845373512     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac00295a044     Document Type: Article
Times cited : (293)

References (29)
  • 18
    • 0003561662 scopus 로고
    • Electrochemical Methods
    • Wiley: New York
    • Bard, A. J.; Faulkner, L. “Electrochemical Methods”; Wiley: New York, 1980; p 566.
    • (1980) , pp. 566
    • Bard, A.J.1    Faulkner, L.2
  • 24
    • 0003561662 scopus 로고
    • Electrochemical Methods
    • Wiley: New York
    • Bard, A. J.; Faulkner, L. “Electrochemical Methods”; Wiley: New York, 1980; p 180.
    • (1980) , pp. 180
    • Bard, A.J.1    Faulkner, L.2
  • 25
    • 0003556817 scopus 로고
    • Electrochemistry at Solid Electrodes
    • Marcel Dekker: New York
    • Adams, R. N. “Electrochemistry at Solid Electrodes”; Marcel Dekker: New York, 1969; p 219.
    • (1969) , pp. 219
    • Adams, R.N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.